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TTTC's Electronic Broadcasting Service |
20th IEEE Latin-American Test Symposium
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CALL FOR PAPERS
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The IEEE Latin-American Test Symposium (LATS, previously Latin-American Test Workshop - LATW) is a recognized forum for test and fault tolerance professionals and technologists from all over the world, in particular from Latin America, to present and discuss various aspects of system, board, and component testing and fault-tolerance with design, manufacturing and field considerations in mind. Presented papers are also published in the IEEE Xplore Digital Library. The best papers of the 20th LATS will be invited to re-submit to IEEE Design & Test,Journal of Electronic Testing: Theory and Applications - JETTA (Springer), Journal of Low Power Electronics - JOLPE (American Scientific Publishers), and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD). Topics of interest include but are not limited to:
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To encourage and facilitate discussions, participation will be limited. Those interested in presenting recent results at the symposium are invited to submit an extended abstract, one to three pages long, or a full length paper. PDF electronic submissions must be done via the symposium‘s webpage: www.lats.tttc-events.org Authors should send papers in the IEEE format. Detailed instructions are available at the symposium‘s webpage. The Program Committee also welcomes proposals for panels and special topic sessions. |
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Submission Deadline (Title and Abstract): November 9th, 2018 Submission (Full paper): November 16th, 2018 Notification of Acceptance: December 20th, 2018 Camera Ready: January 10th, 2019. |
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| Additional Information | |
For additional information, please contact the Program Chair: Victor Champac – INAOE, Mexico Marcelo Lubaszewski, UFRGS, Brazil |
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| Committee | |
General Co-Chairs:
Past General Chair:
Program Co-Chairs:
Local Chair:
Local Arrangement Chair:
Special Session Co-Chairs:
Tutorial Co-Chairs:
Panel Co-Chairs:
Finance Chair:
Publication Co-Chairs:
Publicity Co-Chairs:
TTEP Tutorials Liaison:
IEEE – CEDA Liaison:
IEEE D&T Liaison:
IEEE TCAD Liaison:
JETTA Liaison:
JOLPE Liaison:
Industry Liason:
Steering Committee:
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| For more information, visit us on the web at: http://www.lats.tttc-events.org |
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LATS'19 is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
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IEEE
Computer Society-Test Technology Technical Council |
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TTTC CHAIR
PAST CHAIR
TTTC 1ST VICE CHAIR
SECRETARY TEST WEEK COORDINATOR TUTORIALS AND EDUCATION STANDARDS EUROPE MIDDLE EAST & AFRICA STANDING COMMITTEES ELECTRONIC MEDIA |
PRESIDENT OF BOARD SENIOR PAST CHAIR TTTC 2ND VICE CHAIR FINANCE TECHNICAL MEETINGS TECHNICAL ACTIVITIES ASIA & PACIFIC LATIN AMERICA NORTH AMERICA COMMUNICATIONS INDUSTRY ADVISORY BOARD |
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